My Professional Journey
Professional Milestones
Click to see responsibilities and more details
Independent Consultant – DfT, Test, Yield Management
- Advising executive and engineering leadership on IC manufacturing test strategies
- Implementation and optimisation of test concepts from Design-for-Test, pattern and test program development to high-volume manufacturing
- Manage NPI and yield optimisation phases from proper ramp-up target setting to management of operational issues towards financial objectives
- Support market entry and business development for test tool and equipment suppliers, e.g. European go-to-market strategy, selection of strategic customers, manage customer engagement
- Guide start-ups through setup and funding phases, leveraging technical expertise and contacts e.g. to critical suppliers and potential customers
Apple – Engineering Manager
- Support organisation’s transition into new company after acquisition
- Hands-on software development (C++, Python) for IC qualification and test
Intel – Senior Director, Test and Product Engineering
- Responsibilities: Design-for-Test, test program development, yield management – execution as well as respective methodologies, EDA tools and HVM equipment selection
- Target application: Cellular modem chipsets (RF-Transceiver, Power Management, Digital Baseband)
- Managing engineering teams in Germany, China, Malaysia, US – about 250 heads total
Infineon Technologies – Director, Test Solutions
- Responsibilities: Digital and analog Design-for-Test methodology & tools, test program development tools, i.e. program generators and verification tools
- Target applications: Automotive, communications (wired, wireless), smart cards
- Managing teams in Germany, Austria, and China − about 80 heads total
Philips Semiconductors – DfT Tool Development
- EDA tool developer for Philips Semiconductor’s (now NXP) in-house test tool infrastructure
Education & Publications
My professional career is based on an academic background in electrical engineering, including a PhD, as well as teaching and research activities throughout my entire career, resulting in multiple technical publications in the field of test and Design-for-Test methodologies and implementation.
- PhD in Electrical Engineering, University of Bremen, Germany
- Diploma Electrical & Communications Engineering, University of Hanover, Germany
- Author of multiple publications in DfT and test methodology (selection below)
Publications (Selection)
- Poehl, F.; Demmerle, F.; Alt, J.; Obermeir, H.; Production test challenges for highly integrated mobile phone SOCs – A case study; Invited Talk, 15th IEEE European Test Symposium, 24-28 May 2010, pp. 17–22
- Poehl, F.; Beck, M.; Arnold, R.; Rzeha, J.; Rabenalt, T.; Goessel, M.; On-chip evaluation, compensation and storage of scan diagnosis data; Computers & Digital Techniques, IET, Volume 1, Issue 3, May 2007; pp. 207–212
- Poehl, F.; Beck, M.; Tamarapalli, N.; Kassab, M.; Arnold, R.; Muhmenthaler, P.; Mukherjee, N.; Rajski, J.; Industrial experience with adoption of EDT for low-cost test without concessions; International Test Conference; Sept. 30 – Oct. 2, 2003; pp. 1211–1220